Scanning Electron Microscope
Scanning electron microscope (SEM) is an electron microscope that produces images of a sample by scanning the surface with a focused electron beam. Electrons interact with atoms in the sample, producing various signals containing information about the surface topography and composition of the sample. The electron beam is scanned in a scan scan pattern and the position of the beam is combined with the detected signal to obtain an image. SEM 1 nanometer can achieve better resolution.
This page updated by Metallurgical and Materials Engineering on 20.03.2020 15:26:53